SEGMENTATION ALGORITHMS FOR INDUSTRIAL IMAGE QUANTITATIVE ANALYSIS SYSTEMS

Krzysztof Strzecha, Anna Fabijańska

Abstract

In this paper computerized system for high temperature measurements of superficial properties has been presented. The process of superficial properties determination is based on digital image processing and analysis algorithms. Particular attention has been paid to adaptive thresholding algorithm with a local iterative threshold selection. Algorithm was elaborated to segment images obtained from the measurement process. Moreover, results of proposed algorithm have been presented. In the final stage of the paper difficulties appearing during high temperature measurements have been outlined. The authors have proposed methods of results correctness verification applying essential laws of the optics to a CCD camera lens.

Keywords

image segmentation, thresholding, image quantitative analysis system, surface properties, high temperature measurements

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PWC-2006-TC12-020u.pdf

DOI

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IMEKO TC

TC12 - Temperature and Thermal Measurements

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