Design of High-speed ATE Calibration Equipment
Abstract
The calibration of Automated Test Equipment(ATE) is an important part of microelectronics measurement. To achieve full calibration of high-speed ATE, each high-speed digital channel should be traced to the calibration equipment. Calibrating each channel individually with an instrument will pose a great challenge to the calibration of ATE, and channel switching will increase a large amount of calibration time. This paper puts forward a design solution of calibration equipment of high-speed ATE, which can realize the versatility and portability of calibration equipment, and realize multichannel automatic calibration progress.
Event details
- Event
- tc4-2020