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OUT OF MACHINE CALIBRATION TECHNIQUE FOR ANALOG PROBES

J.J. Aguilar, J.A. Yagüe, J.A. Albajez, J. Velázquez

Abstract

A technique for the out of machine calibration of analog probes for CMM is presented in this paper. The process and the results obtained in different tests carried out on two different probes are shown. This calibration procedure allows to find out the measuring errors of these systems in a quick and reliable way.

Keywords
analog probe, calibration, coordinate measuring machine
Download
PWC-2006-TC14-021u.pdf
DOI
-
IMEKO TC
TC14 - Measurement of Geometrical Quantities

Event details

Event
XVIII IMEKO World Congress
Place
Rio de Janeiro, BRAZIL
Time
17 September 2006 - 22 September 2006
Website
http://www.metrologia2006.org.br

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