Reliability estimation of Inertial Measurement units using Accelerated Life Test

Marco Carratù, Marcantonio Catelani, Lorenzo Ciani, Gabriele Patrizi, Antonio Pietrosanto, Paolo Sommella

Abstract

In many different technological and industrial fields microelectronic device reliability is rising up as a fundamental aspect to consider during the design of diagnostic, optimization and control systems. Unexpected failures in diagnostic and control units could lead to a severe impact on the entire system/plant availability. Thus, reliability analysis must be carried out during the early phase of the design. MEMS (Micro-Electro-Mechanical Systems) based Inertial Measurement Units are widespread in diagnostic units to monitor acceleration, position and angular velocity of machinery. However, recent literature lack of a reliability estimation for this kind of devices. Thus, this paper proposes a measurement setup and a customized Accelerated Life Test plan for reliability estimation of a set of Inertial Measurement Units. A temperature-based stress test based on the HTOL (High Temperature Operating Life) protocol have been carried out to age the devices with the aim of obtaining a failure dataset. Results of the test have been used to predict device’s reliability.

Keywords

Arrhenius; Accelerometer; Gyroscope; Reliability; Testing; Industry; Innovation and Infrastructure

Download

IMEKO-TC10-2022-010.pdf

DOI

10.21014/tc10-2022.010

IMEKO TC

TC10 - Measurement for Diagnostics, Optimization and Control

Back to the proceedings