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Effect of System Pressure on Liquid Film Behavior in Horizontal Annular Flow

Ning Zhao, Tian Zhang, Xianle Zang, Long Xu, Jing Wang

Abstract

The measurement of liquid film parameters is of great significance in the momentum transfer and heat transfer characteristics of gas-liquid two phase in annular flow. The liquid film at the bottom of the horizontal annular flow is the thickest and produces the greatest influence on the nature of the annular flow. In large diameter horizontal pipes, the effect of pressure on liquid film behavior lacks systematic discussion. Therefore, a dynamic measurement system for annular flow liquid film was designed based on near-infrared(NIR) sensing technology to complete the measurement of annular flow liquid film thickness data under five pressures. The average liquid film thickness at the bottom is obtained by variational modal decomposition(VMD) of the time series signal, and the wave velocity parameter is obtained by mutual correlation velocimetry. The article initially discusses the effect of pressure on the average thickness of the bottom liquid film as well as the interfacial wave velocity.

Keywords
System Pressure; VMD; Liquid film
Download
IMEKO-TC9-2019-043.pdf
DOI
10.21014/tc9-2022.043
IMEKO TC
TC9 - Flow Measurement

Event details

Event
FLOMEKO 2022
Technical Committee
TC9
Email
lich@nim.ac.cn
Place
Chongqing, CHINA
Time
1 November 2022 - 4 November 2022
Website
http://flomeko2022.msmk.tech/c/index.html

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