Demonstration stand for non-destructive conductive material defect inspection by eddy current

Jan Saliga, Pavol Kababik, Ondrej Kovac, Alena Pietrikova

Abstract

To aid in the education of master's level electronic engineering students in our department, we have developed a simple stand that utilizes eddy currents for the non-destructive testing of conductive materials. This method is commonly used for detecting various cracks in the material. The purpose of the stand is to demonstrate the basic idea of such testing during laboratory exercises. The article details the design and implementation of the measuring stand, which includes a measuring device, reference test samples, and accessories. The measuring device is based on the myRIO DAQ device by NI and features a sensing probe that contains an excitation coil, a GMR magnetoresistor AA002-02, and a laser motion sensor. The control software for myRIO was developed in LabVIEW and utilizes both the processor and FPGA in myRIO.

Keywords

nondestructive, conductive material, defect inspection, eddy current

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IMEKO-TC4-2023-37.pdf

DOI

10.21014/tc4-2023.37

IMEKO TC

TC4 - Measurement of Electrical Quantities

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