UNCERTAINTIES OF MULTI SENSORS CMM MEASUREMENTS APPLIED TO HIGH QUALITY SURFACES

Jean Marc Linares, Jean Mailhé, Jean Michel Sprauel

Abstract

A statistical approach, based on a maximum likelihood criterion, is used to define the uncertainties of the derived element associated to a set of measured coordinates. The method is applied to high quality surfaces of low extent.

Keywords

Uncertainties, Measurement

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PWC-2006-TC21-024u.pdf

DOI

-

IMEKO TC

TC21 - Mathematical Tools for Measurements

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