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Measuring Privacy: Critical Reflections and Directions for a Metrology-Based Approach
Eulalia Balestrieri, Ilaria Amelia Caggiano, Francesco Picariello, Ioan Tudosa
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Abstract:Privacy measurement in digital systems lacks a standardised metrological framework to ensure reliable and comparable assessments. A metrological approach ensures that privacy measurements are reliable, reproducible, and comparable over time and across different contexts. In this work most common privacy metrics, including k-anonymity, ℓ-diversity, t-closeness, differential privacy, and mutual information, are critically evaluated, identifying their strengths and limitations from a metrological perspective. Initial directions and open challenges toward a metrology-based approach to privacy measurement are outlined, too.
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DOI:tc6-2025.019
Event details:
[EVENTDETAILS]
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IMEKO TC:TC6
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Event name:TC6 M4Dconf2025
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Title:
2025 IMEKO TC-6 International Conference on Metrology and Digital Transformation
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Place:Benevento, ITALY
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Time:3 September 2025 - 5 September 2025