DEVELOPING MODEL-BASED DESIGN EVALUATION FOR ALGORITHMIC A/D CONVERTERS

Ondřej Šubrt, Pravoslav Martinek, Carsten Wegener

Abstract

In this paper we propose a novel Design Evaluation concept suitable for Nyquist-rate A/D converters employing the recently introduced technique of LEMMA (Linear Error Mechanism Modeling Algorithm). The core of our methodology is a root-cause identification of the error sources present in the ADC structure, evaluating the performance degradation by static non-linearity in a series of consecutive steps. Our solution benefits a wide scale of design optimization and device calibration possibilities, as it is demonstrated on a design example of Switched-Current (SI) algorithmic ADC. The results introduced in this paper are proven by full-transistor level and behavioral ADC simulation, back-annotating the parameters of its basic circuit element (SI memory cell) from the measurement of available silicon samples.

Keywords

Design Evaluation, analog testing, error mechanism, linear modeling, Switched-Current, Nyquistrate A/D converter

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PWC-2006-TC4-IWADC-005u.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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