MEASURING DETERMINISTIC JITTER USING TIME INTERVAL MEASUREMENT SYSTEM

S. Grzelak, M. Zieliński, D. Chaberski

Abstract

This paper describes the method of analysis of the measuring data obtained from low resolution and non-linear Time Interval Measurements System (TIMS) implemented in to FPGA device. Information about quantization and nonlinearity errors of TIMS warrants more precise analytical results during deterministic jitter investigation. The probability density function of the time-interval fluctuation can be very helpful during diagnosing of the jitter sources. As source of signal with deterministic jitter was used digital Delay Locked Loop (DLL) block, embedded in Virtex-E device. The TIMS with the suitable processing of the data allows observe and measure peak-to-peak value of deterministic jitter on the level of resolution of TIMS.

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IMEKO-IWADC-2008-125.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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