DISCRETE LINEAR FILTERS FOR METROLOGY

M. Krystek, P.J. Scott, V. Srinivasan

Abstract

Linear filters are used quite extensively in the field of dimensional metrology and surface texture for smoothing data collected from measurements. Past application of linear filters was largely limited to the Gaussian and 2RC filters. But recent advances in spline and wavelet theories have opened the way for more flexible and powerful linear filters that are getting more attention in industry. This paper describes these advances in linear filters and how they are influencing the development of ISO filter standards.

Keywords

metrology, linear filters, ISO standards

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IMEKO-WC-2000-TC14-P379.pdf

DOI

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IMEKO TC

TC14 - Measurement of Geometrical Quantities

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