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PRIOR INFORMATION IN PRODUCT-RATIO MEASUREMENTS

V. Tuninsky, W. Wöger

Abstract

In this paper we consider direct repeated measurements of a quantity <i>R</i> that is defined by the product <i>P</i><sub>1</sub><sup><i>n</i><sub>1</sub></sup> &middot; <i>P</i><sub><i>m</i></sub><sup><i>n</i><sub><i>m</i></sub></sup> (<i>n</i><sub>1</sub>, ... ,<i>n</i><sub><i>m</i></sub> = &plusmn;1 ) of <i>m</i> other quantities. Bayes theorem is applied to obtain posterior estimates of <i>R</i> and <i>P</i><i>&alpha;</i> (<i>&alpha;</i> = 1, ..., <i>n</i>) based on the measurements of <i>R</i> and prior information (estimates, associated uncertainties) about <i>P</i><i>&alpha;</i>. The paper extends a previous result applicable to a calibration chain with only two elements to chains with arbitrary number of elements.

Keywords
evaluation of measurement results, traceability in metrology
Download
IMEKO-WC-2000-EVL-P546.pdf
DOI
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Event details

Event
XVI IMEKO World Congress
Place
Vienna, AUSTRIA
Time
25 September 2000 - 28 September 2000

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