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CHARACTERISATION AND MODELLING OF THE ADC JITTER

P. Arpaia, P. Daponte, F. Maccaro, S. Rapuano

Abstract

The use of the Allan variance for the characterisation of the jitter error in analog-to-digital converters (ADCs) is proposed. In particular, the Allan variance is a sound basis for defining a figure of merit for jitter errors, diagnosing the jitter noise type, and including a jitter block into a previously proposed ADC model. Experimental results highlighting the effectiveness of the Allan variance in the characterisation of the ADC jitter error are discussed.

Keywords
jitter, A/D Converters, Allan variance
Download
IMEKO-WC-2000-EWADC-P603.pdf
DOI
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Event details

Event
XVI IMEKO World Congress
Place
Vienna, AUSTRIA
Time
25 September 2000 - 28 September 2000

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