CHARACTERISATION AND MODELLING OF THE ADC JITTER
Abstract
The use of the Allan variance for the characterisation of the jitter error in analog-to-digital converters (ADCs) is proposed. In particular, the Allan variance is a sound basis for defining a figure of merit for jitter errors, diagnosing the jitter noise type, and including a jitter block into a previously proposed ADC model. Experimental results highlighting the effectiveness of the Allan variance in the characterisation of the ADC jitter error are discussed.
Event details
- Event
- XVI IMEKO World Congress
- Place
- Vienna, AUSTRIA
- Time
- 25 September 2000 - 28 September 2000