DESIGN OF ADC HISTOGRAM TEST: A PRACTICAL CASE

Giovanni Chiorboli

Abstract

In this paper, the results of the most recent studies on the sinewave histogram test are considered. Particular emphasis is dedicated to the choice of the values that the test parameters must assume for obtaining a specified measurement uncertainty. Finally, a practical example of how to organize the test of a high-speed, 12-bit converter is proposed, and some results are given which validate the theory.

Keywords

Analog-to-Digital converter, histogram test, uncertainty

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IMEKO-WC-2000-EWADC-P610.pdf

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