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REPRODUCIBILITY OF THE JITTER MEASUREMENT

J. Halámek, M. Kasal, M. Villa, P. Cofrancesco

Abstract

The validity of the ADC noise model and jitter error are discussed and tested by measurement.

Keywords
ADC measurement, ADC noise, jitter
Download
IMEKO-WC-2000-EWADC-P620.pdf
DOI
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Event details

Event
XVI IMEKO World Congress
Place
Vienna, AUSTRIA
Time
25 September 2000 - 28 September 2000

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