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THE PERFORMANCE TEST OF THE AD CONVERTERS EMBEDDED ON SOME MICROCONTROLLERS

R. Holcer

Abstract

The paper deals with some metrological parameters of the ADC implemented on AT90S8535 and ADuC812 microcontroller chips. As a criterion of ADC precision, which allows to determine the operational condition limits, the number of effective bits has been chosen. More over, the DNL and INL measured characteristics are presented. The results are compared to some of the data brought out in vendors’ data sheets.

Keywords
ADC performance testing, ADC errors and precision, microcontrollers
Download
IMEKO-WC-2000-EWADC-P623.pdf
DOI
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Event details

Event
XVI IMEKO World Congress
Place
Vienna, AUSTRIA
Time
25 September 2000 - 28 September 2000

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