UNCERTAINTY EVALUATION IN DITHERED A/D CONVERTERS

Filippo Attivissimo, Nicola Giaquinto, Mario Savino

Abstract

In this paper formulae for evaluating the uncertainty of measurements (direct and indirect) performed by means of an ADC-based device are presented. The complex technique of dithering is used to reduce the effect of noise and to increase the ADC resolution. The authors discuss a way of writing and interpreting the uncertainty specifications of ADCs.

Keywords

uncertainty, measurement error, A/D converters

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IMEKO-TC7-2004-017.pdf

DOI

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IMEKO TC

TC7 - Measurement Science

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