METROLOGICAL ASPECTS OF NON-STATIONARY SIGNAL TRANSFORMATION FOR DYNAMIC SPECTRUM ANALYSIS

G. F. Malykhina, A. V. Merkusheva

Abstract

The non-stationary signal spectrum in the information measurement system (IMS) is based on twodimension time-frequency transformation (TFT). Although the precision of the computer TFT provides the errors much less than a limit of practical significance, the transformation result relates not to uniquely determined point, but to some uncertainty cell, the size of which is determined by “metrological” characteristics (MC) of TFT. The cell may change its form in the time-frequency domain, but its limitations stays not smaller than limit minimum value that relates to resolution limit capability of TFT. In the paper, we give the MC estimation for one of widely used spectrogram TFT. The global (applicable to the whole time-frequency plane) and local MC (legible only near some definite point), and their correlation are given in the paper.

Keywords

metrological characteristics, time-frequency transformation, spectrogram, cell of uncertainty

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IMEKO-TC7-2004-032.pdf

DOI

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IMEKO TC

TC7 - Measurement Science

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