DYNAMIC DAC TESTING BY REGISTERING THE INPUT CODE WHEN THE DAC OUTPUT MATCHES A REFERENCE SIGNAL
Abstract
The accuracy of Digital to Analog Converters (DACs) is becoming important proportionally to the requirement on low distortion of the generated signals. This paper presents a new method for measuring the transfer characteristics of high resolution DACs under dynamic condition. The proposed method is based on the comparison of the DAC analog output voltage with a reference signal by using a fast comparator and registration of the DAC digital input code word in the moment when the DAC analog output voltage exceeds the reference voltage. The registration of the digital input code word into a fast memory is controlled by the comparator output. The reference signal is the superposition of the DC voltage generated by the DAC and a slow dithering voltage. Its average value is measured by a precision voltmeter which secures the required metrological accuracy. After digital processing the registered sequence of digital code words is used to determine the Integralnonlinearity (INL) and the Differential-nonlinearity (DNL) of the DAC under test.
Event details
- Event
- IWADC 2011
- Technical Committee
- TC4
- Place
- Orvieto, ITALY
- Time
- 30 June 2011 - 1 July 2011
- Website
- http://www.iwadc2011.diei.unipg.it/Sito/IWADC2011.html