THE NEW IEEE-STD-1241-2010 FOR ANALOG-TO-DIGITAL CONVERTERS

Steven J. Tilden, Solomon M. Max

Abstract

IEEE Standard 1241-2010 “Terminology and Test Methods for Analog-to-Digital Converters” defines terminology and specifications and describes test methods for measuring the performance of ADC’s. The standard is written for manufacturers and users of ADC’s for use in both static and dynamic applications. The main purpose of this standard is to ensure that manufactures and users of ADC’s have a well-defined set of terms, specifications and test methods so they can understand, describe, and compare the performance of these A/D converters using a common language, with clear definitions. IEEE-Std-1241-2010 was created by the Analog-to-Digital Converter Subcommittee of Technical Committee 10 (TC-10) Waveform Generation, Measurement, and Analysis. TC-10 is part of the IEEE Instrumentation and Measurement Society.

Download

IMEKO-IWADC-2011-41.pdf

DOI

-

IMEKO TC

TC4 - Measurement of Electrical Quantities

Back to the proceedings