A Solution of The Integrated μBIST for Functional and Diagnostic Testing in Mixed-Signal Electronic Embedded Systems

Dariusz Załeski, Romuald Zielonko

Abstract

The paper concerns the testing of analogue circuits and blocks in mixed-signal electronic embedded systems (EESs), using the built-in self-test (BIST) technique. The integrated μBIST based on reusing signal blocks already present in an EES, such as processors, memories, ADCs, is presented. The novelty of the solution is the extended functionality of the μBIST. It can perform 2 testing functions: functional testing and fault diagnosis on the level of localization of a faulty element. For functional testing, the complementary signals (CSs), and for fault diagnosis the SBT vocabulary techniques have been used.

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IMEKO TC

TC10 - Measurement for Diagnostics, Optimization and Control

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