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LOW COHERENCE INTERFEROMETRY FOR THE INLINE MEASUREMENT OF TRANSLUCENT MULTILAYER STRUCTURES

S. Hölters, C. Farkas, R. Fleige, A. Lenenbach, R. Noll

Abstract

In a joint national project with industrial partners in the sectors of sensor technology, mechanical engineering and plastic film production, the Fraunhofer Institute for Laser Technology (ILT) has developed a novel optical sensor to monitor the production of plastic films based on interferometric measurements with low coherent radiation. This technique of Optical Coherence Tomography (OCT) is an imaging method generating high-resolution tomography scans. The sensor measures the thicknesses of single layers in multilayer films allowing for the first time inline process monitoring and efficient process guiding of flat-film and blow-film extrusion lines.

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IMEKO-TC14-2011-21.pdf
DOI
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IMEKO TC
TC14 - Measurement of Geometrical Quantities

Event details

Event
TC14 LMPMI Symposium 2011
Technical Committee
TC14
Place
Braunschweig, GERMANY
Time
12 September 2011 - 14 September 2011
Website
http://www.lasermetrology2011.com

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