Towards a harmonized treatment of dynamic metrology

Sascha Eichstädt, Clemens Elster

Abstract

Dynamic metrology is a topic of growing importance at NMIs and in industry, and it is considered in an increasing number of application areas. Guidance documents, such as the Guide to the Expression of Uncertainty in Measurement (GUM) [1] and the International Vocabulary of Metrology (VIM) [2], are currently not addressing dynamic measurements, and there is an increasing need for a harmonized treatment of dynamic metrology. To this end, we suggest a generic and versatile approach for the mathematical and statistical modeling of dynamic measurements, which also provides a basis for a harmonized vocabulary.

Keywords

dynamic measurement, uncertainty, signal processing, state-space system

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DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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