OPTICAL DIFFERENTIATION PHASE MEASUREMENT USING A MODIFIED MULTI-STEP BIAS-SHIFTING METHOD
Abstract
An optical differentiation phase measurement system using a modified multi-step bias-shifting method is proposed. The signal obtained by multi-step bias shifting is divided into two groups in this new method. The effectiveness of the new method was demonstrated using a computer simulation.
Event details
- Event
- XVIII IMEKO World Congress
- Place
- Rio de Janeiro, BRAZIL
- Time
- 17 September 2006 - 22 September 2006
- Website
- http://www.metrologia2006.org.br