Skip to main content

OPTICAL DIFFERENTIATION PHASE MEASUREMENT USING A MODIFIED MULTI-STEP BIAS-SHIFTING METHOD

Hideo Furuhashi, Yoshiyuki Uchida, Kiyofumi Matsuda, Akihiro Kono

Abstract

An optical differentiation phase measurement system using a modified multi-step bias-shifting method is proposed. The signal obtained by multi-step bias shifting is divided into two groups in this new method. The effectiveness of the new method was demonstrated using a computer simulation.

Keywords
phase measurement, wavefront, optical differentiation
Download
PWC-2006-TC2-008u.pdf
DOI
-
IMEKO TC
TC2 - Photonics

Event details

Event
XVIII IMEKO World Congress
Place
Rio de Janeiro, BRAZIL
Time
17 September 2006 - 22 September 2006
Website
http://www.metrologia2006.org.br

Back to the proceedings