Optimal Non-parametric Estimation of 1/f Noise Spectrum in Semiconductor Devices

Paolo Magnone, Pier Andrea Traverso, Claudio Fiegna

Abstract

In this paper, we discuss the optimal nonparametric estimation of 1/f noise in MOSFET devices. We adopt a simple experimental procedure to evaluate the performance of different methods for the spectrum estimation. In particular, we analyze the variance of the spectrum in the case of averaged periodograms, according to Bartlett and Welch methods. The influence of the adopted window function and of the overlap between segments is investigated. Finally, an optimal power spectrum estimation is identified, allowing to minimize the dispersion of the spectrum.

Keywords

1/f noise; MOSFET; non-parametric methods; PSD; Welch method.

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DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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