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EVALUATION OF FREQUENCY DEPENDENCY OF EFFECTIVE NUMBER OF BITS BY MEANS OF STOCHASTIC TESTING SIGNAL

Jan Holub, Josef Vedral

Abstract

The article describes a new method of Analog-to-Digital Converters testing that is suitable for testing of highresolution AD converters (e.g. Σ-Δ or dither-based) or on the contrary ultra high-speed AD converters. The method is based on the histogram test driven by stochastic signal with defined probability density function. By repeating of the test for different settings of band-pass filter that is inserted to the input testing signal path it is possible to obtain an estimation of frequency dependency of effective number of bits. This important information was obtainable by deterministic test only. Practical demonstration confirmed the usability of the method.

Keywords
ADC, ENOB, testing, stochastic signal
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IMEKO-TC4-2001-048.pdf
DOI
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IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
TC4 Symposium 2001
Technical Committee
TC4
Place
Lisbon, PORTUGAL
Time
13 September 2001 - 14 September 2001

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