FREQUENCY DOMAIN ANALYSIS FOR INTEGRAL NONLINEARITY MEASUREMENT IN A/D CONVERTERS WITH DITHER

Francesco Adamo, Filippo Attivissimo, Nicola Giaquinto, Mario Savino

Abstract

The paper examines the problem of achieving a fast measurement of nonlinearity for a dithered converter. It is shown that, since dither removes small-scale systematic errors, measuring the remaining large-scale (smooth) nonlinearity can be efficiently achieved via a fast frequency domain test, formerly analyzed by the authors for conventional converters without dither. The test appears especially suited for dithered converters, and can be useful for the periodic adjustment of a look-up table intended for removing large-scale nonlinearities.

Keywords

analog-digital conversion, data acquisition, nonlinear systems, dithering

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IMEKO-TC4-2001-054.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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