METROLOGICAL MODELLING OF Σ-Δ ADC

Valeriy I. Didenko, Izzet Kale, Andrey L. Movchan, Juriy S. Solodov

Abstract

The paper uses a metrological approach to modelling of Σ-Δ ADC. The main goal of such modeling is possibility to evaluate the uncertainty of A-D conversion with given probability. The main attention is devoted to errors produced by noise. Analysis uses both frequency and time domains. The application of the metrological modelling is demonstrated at the example of the concrete ADC manufactured by Analog Devices company. The paper is based on application of metrology in design made in MPEI (Russia) as well as on widespread investigations of Σ-Δ ADC fulfilled in University of Westminster (England).

Keywords

sigma-delta analog-to-digital converter, quantization noise, metrological modelling

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IMEKO-TC4-2001-058.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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