AFTER IEEE STD 1241: WHAT’S NEXT ?

Thomas E. Linnenbrink, Steven J. Tilden, Michael Hartshorne, Jerome J. Blair, Erik McCarthy, Don Hummels

Abstract

While the release of IEEE Std 1241-2000 early in 2001 is a major milestone, it is not the end of the ADC standards project. Work continues on improving test methods. A common thrust is to reduce test time (and cost) while maintaining or improving the precision and accuracy of the result. Examples of methods under consideration include a more efficient means of determining offset, equivalent-time testing with imprecise pulses, and automatic sine wave fitting. This paper presents progress to date.

Keywords

ADC, Sinefit, FFT, histogram, step response, equivalent time sampling, IEEE Std 1241-2000, IEEE Std 1057-1994

Download

IMEKO-TC4-2001-129.pdf

DOI

-

IMEKO TC

TC4 - Measurement of Electrical Quantities

Back to the proceedings