A METHOD FOR THE IN-CIRCUIT TESTING OF SD MODULATORS

José Machado da Silva, Jorge S. Duarte, José S. Matos

Abstract

A method for characterizing Σ&Delta modulators is described which can be built in large integrated circuits or systems-on-chip. The method can be used to measure gain and phase, as well as, total harmonic distortion and signal to noise and harmonic distortion ratio parameters. It is prone to be built in circuit, when computational resources such as digital signal processors or re-programmable logic are available, but can also be used in computer simulations making it easier to compare expected with measured performances.

Keywords

SD converters, embedded test

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IMEKO-TC4-2001-158.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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