IMPROVEMENT OF THE TIME-INTERVAL MEASUREMENT SYSTEM PARAMETERS BY MULTIPLICATION THE NUMBER OF ITS COMPONENTS

D. Chaberski, M. Gurski, M. Zielinski

Abstract

The paper contains description of TI (Time-Interval) measurement system implemented in FPGA (Field-Programmable-Gate-Array) structure whose such parameters as measuring uncertainty and maximal intensity of registered TSs (Time-Stamp) have been improved by the multiplication the number of its components. In this research the resolution has been increased by multiple TDL (Tapped-Delay-Line) use and the maximal intensity has been increased by hardware parallel processing implementation.

Keywords

FPGA, time-interval, histogram, time-stamp, tapped-delay-line

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IMEKO-WC-2015-TC7-187.pdf

DOI

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IMEKO TC

TC7 - Measurement Science

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