APPLICATION OF RANDOM FOREST TO THE FAULT DETECTION IN ANALOG CIRCUITS
Abstract
The paper presents the application of the Random Forest (RF) to the diagnostics of analog circuits. The modified structure of the forest proposed for the task and its generation algorithm is presented. The approach is used to detect parametric faults in the fifth order lowpass filter. Multiple versions of the forest are tested. The proposed method is also confronted against the decision tree, being superior over the traditional classifier. The future prospects of the approach are considered.
Event details
- Event
- XXI IMEKO World Congress
- Place
- Prague, CZECH REPUBLIC
- Time
- 30 August 2015 - 4 September 2015
- Website
- http://imeko2015.org/