OPTIMIZATION METHODS IN METROLOGY OF ELECTRICAL QUANTITIES

Marija Cundeva-Blajer

Abstract

In electrical quantities metrology numerous examples of stochastic processes exist and a need for optimal solutions is posed. Here stochastic genetic algorithm optimization is used for solving two typical metrological problems: errors minimization in process of instrument’s design and predicting metrological reference standards time-drift. The first case is optimal metrological design of a combined instrument transformer and the second case is analysis of resistance standard time-drift.

Keywords

optimization, genetic algorithm, electrical measurements, instrument transformer, resistance standard

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IMEKO-WC-2015-TC21-386.pdf

DOI

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IMEKO TC

TC21 - Mathematical Tools for Measurements

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