Characterization and Volume Test of the AM06 Chip

Seyed Ruhollah Shojaii, Alberto Annovi, Davide Banfi, Matteo Beretta, Francesco Crescioli, Luca Frontini, Valentino Liberali, Lorenzo Marcellino, Alberto Stabile

Abstract

This paper presents a methodology for the characterization and the industrial testing of a very complex Application-Specific Integrated Circuit (ASIC). The proposed test system is being installed at a company and it is very user friendly also for a non specialized operator.<BR />This framework has been developed within a collaboration by the Istituto Nazionale di Fisica Nucleare (INFN) and the Laboratoire de Physique Nucléaire et de Hautes Energies (LPNHE), and the same test setup is installed in the laboratories of INFN-Milan, INFNFrascati and LPNHE-Paris.

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IMEKO-TC10-2016-006.pdf

DOI

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IMEKO TC

TC10 - Measurement for Diagnostics, Optimization and Control

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