IGBT Testing: a revised approach from a metrological perspective

Roberto Ottoboni, Sathish Kumar Packiam

Abstract

The usage of IGBTs in power electronics field is increasing day by day and drawing the attention of researchers to characterize its application in different fields. One of the most important parameters for the designers is to determine the energy losses introduced by these devices. The manufacturers of IGBT do not always provide this parameter in the same way and very often at comparable values of the parameter may correspond different behaviors. Moreover, in the tests carried out by manufacturers, some aspects that are responsible for a significant measurement uncertainty are neglected or underestimated. With the development of two new measurement system, this paper investigates about some particular sources of uncertainty that can affect static and dynamic loss of IGBT measurements. In particular, evaluation on the effect of self-heating process in the measurement of voltage drop Vce across the collector emitter terminal. In addition, this paper presents the effect of socket that holds the DUT in the measurement of Vce. Finally, the result of investigation on the effect of stray inductance in the switching characteristic measured with the developed measurement system is compared to the switching characteristics given by the manufactures in the data sheet.

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DOI

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IMEKO TC

TC10 - Measurement for Diagnostics, Optimization and Control

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