SHORT-TERM FREQUENCY STABILITY OF DIGITIZER TESTING SIGNALS

Michal Široký, Jan Čermák, Jaroslav Roztočil

Abstract

In this paper we will discuss methods that can be readily used for frequency (phase) stability measurements of testing signals. To illustrate the case we will describe the measurements on two function generators for ADC testing, a HP33120A and Agilent 33250A, carried out at the Standard Time and Frequency Laboratory of the Institute of Radio Engineering and Electronics (IREE), Prague.

Keywords

ADC testing, testing signal, short-term frequency stability

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IMEKO-IWADC-2003-30.pdf

DOI

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IMEKO TC

TC4 - Measurement of Electrical Quantities

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