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A Frequency-Domain Approach to ADC Phase-Plane Modeling and Testing

Conceição Líbano Monteiro, Pasquale Arpaia, António Cruz Serra

Abstract

An alternative spectrum-based approach for determining the phase-plane error of an analog-to-digital converter is proposed. The method exploits a phase-plane error modeling, based on a dual-tone input stimulus and an output spectrum analysis [1]-[2]. In this way, the amount of data required by the dual-tone histogram test [3] is reduced.

Keywords
Analog-to-digital converters, dynamic testing, nonlinearity, phase plane, frequency domain test, dual tone
Download
IMEKO-IWADC-2003-42.pdf
DOI
-
IMEKO TC
TC4 - Measurement of Electrical Quantities

Event details

Event
iwadc-2003

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