Statistical Performance of Gaussian ADC Histogram Test

A. Moschitta, P. Carbone, D. Petri

Abstract

In this paper, the statistical properties of the Gaussian Histogram Test (GHT) are theoretically evaluated and compared to the corresponding Cramér-Rao Lower Bound (CRLB). In particular, it is shown that the GHT is asymptotically unbiased and efficient. Finally, the GHT is compared to the Sinewave Histogram Test (SHT) one.

Keywords

Gaussian Histogram Test, Sinewave Histogram Test, Cramér-Rao Lower Bound

Download

IMEKO-IWADC-2003-52.pdf

DOI

-

IMEKO TC

TC4 - Measurement of Electrical Quantities

Back to the proceedings