M. Seo, S. Jeong, J. Park, H. Shin
Rayleigh scattering thermometry is a practically applicable non-invasive measurement technique to investigate a gas flow field. Experimental results of Rayleigh scattering thermometry at the low temperature region from 230 K to 310 K are discussed with applying nitrogen and carbon dioxide. More precise measurement can be achieved by applying the carbon dioxide gas with high Rayleigh scattering cross section area. Several issues which should be handled importantly for a closed visualization experiment system at low temperature, such as frost on windows, sealing for insulation, thermal...
XX IMEKO World Congress
· TC12
· 2012
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Yu Yamaguchi, Yoshiro Yamada, Juntaro Ishii
This paper describes a new setup at National Metrology Institute of Japan (NMIJ) to measure spectral responsivities of radiation thermometers. We use a single monochromator and a supercontinuum source instead of a lamp. The spectral power, stability and special uniformities of the system were measured.
XX IMEKO World Congress
· TC12
· 2012
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D. del Campo, J. Bojkovski, M. Dobre, E. Filipe, M. Kalemci, A. Merlone, J. Pearce, A. Peruzzi, F. Sparasci, R. Strnad , D. Taubert, E. Turzó-András
In the frame of the European Metrology Research Program (EMRP) a new joint research project focused on the development of new advances techniques for providing improved traceability to the kelvin, to support its wider and simpler dissemination to the users, is being carried out. This project (SIB10 NOTED) is supported by EURAMET and the European Commission as part of the targeted program “SI Broader Scope” aimed to underpin the needed development of the SI system through Metrology R&D for fundamental and applied metrology. This paper presents a general description of the SIB10 NOTED...
XX IMEKO World Congress
· TC12
· 2012
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Y. Toyoda, T. Seo, T. Iuchi
This paper presents a non-contact temperature measurement method for silicon wafers with combined utilization of transmittance technique at low temperature and radiation thermometry at high temperature because wafers are semitransparent at temperatures less than 600 °C and opaque at more than that. In this method, we utilize polarization technique and the Brewster angle between air and dielectric films that are grown on silicon wafers. The measurements are performed at the same geometrical arrangement and unaffected by dielectric film thicknesses. As a result, the combined method is widely...
XX IMEKO World Congress
· TC12
· 2012
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M. A. P. Castanho, C. R. Baldo
This paper presents a study on the measurement of thermocouple inhomogeneity and its contribution to the calculation of the uncertainty of thermocouple calibration. This study evaluated 26 thermocouples, including noble metal thermocouples (type S, R and B) and base metal thermocouples (type N, K, T and J). The measurements were carried out in alcohol, oil and salt baths, at temperatures from -40 ° C to 420 ° C. In this paper we propose a correlation of inhomogeneity value for each thermocouple type evaluated, considering the temperature range and immersion depth.
XX IMEKO World Congress
· TC12
· 2012
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K. Yamazawa, J. Tamba, C. Urano, Y. Fukuyama, T. Oe, M. Maruyama, A. Domae, N. Kaneko
As a joint project of the Quantum Electrical Metrology Section and the Thermometry Section of the National Metrology Institute of Japan, AIST, we have initiated a project on developing a system for the Johnson Noise Thermometry (JNT). This paper describes the objective, how we combine the technologies, the various phases of the projected plan for the system development, as well as the results of the of the project up to the present.
XX IMEKO World Congress
· TC12
· 2012
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AdityaAchmadi, HelmiZaini, HidayatWiriadinata, Seung-Nam Park, GhufronZaid
Measurement of spectral responsivity of KIM-LIPI standard radiation thermometer had been conducted. With several adjustments, the absolute cryogenic radiometer (ACR) setup was utilized as a primary spectral responsivity comparator to carry out the measurement. Output of double monochromator was redirected to enable the measurement. Additional voltmeter is installed in front of the available less accurate meter of the ACR setup to read the low level signal and provide analog output with enough accuracy. The setup provides a good quality of spectrally-selected light for this purpose without...
XX IMEKO World Congress
· TC12
· 2012
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Sangwook Seo, Doyoung Lee, Kangyoung Sung, Ouseph Padickakudi
KRISS, the national metrology institute (NMI) of Korea, is expanding its official development assistance (ODA) in metrology for developing economies, in harmony with the Korean Government’s policy. KRISS’s programme puts emphasis on developing the human resources, strengthening the measurement facilities, and advancing the quality management systems of its partner NMIs. The UNIDO-KRISS project is one of several recent human resources development (HRD) programs. The ultimate goal of the KRISS ODA is to promote the capabilities of its partner NMIs so that they are ready to participate in the...
XX IMEKO World Congress
· TC11
· 2012
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Edi Kulderknup, Argo Pandis
Problem of measuring instruments calibration near zero value exists by accreditation of calibration laboratories. Some calibration laboratories present its calibration capability minimum value as 0 [with measuring unit of quantity g] and others with some deviation Δ g from 0. Often it is given as Δ g ≈ U ( g ), where U ( g ) is the expanded uncertainty. As concrete example can be given air relative humidity measuring instruments calibration, where measuring instrument has in the calibration certificate indication 0.3% relative humidity with expanded uncertainty U = 0.7% relative humidity, (...
XX IMEKO World Congress
· TC11
· 2012
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Weverton Oliveira Dias, Túlio Fernandes de Oliveira, Adriano César Machado Pereira, Laura Rosa Gomes França
This article deals with the development of a metrological infrastructure Web system. This is the first system developed for universities and research and development institutions in Brazil. This system is a first module the of this Web system in Federal Center for Technological Education of Minas Gerais (CEFET-MG) called "Basic Industrial Technology" - TIB (Portuguese acronym).
XX IMEKO World Congress
· TC11
· 2012
· Download