António Cruz Serra
In this paper, new state of the art analog-to-digital converters (ADCs) testing techniques both static and dynamic are revised and discussed. Regarding the static test it is shown that a new technique based on the use of small triangular waves superimposed with a variable offset value as input signal, reduces dramatically the test duration. This histogram based technique can be implemented by using low cost generators even for high resolution ADC testing. In relation to the dynamic test, a variant of the traditional histogram test using Gaussian noise as stimulus signal is discussed. It...
TC4 Conference and Workshop 2002
· TC4
· 2002
· Download
Franco Maloberti
This paper presents a possible evolution of base station architectures in the frame of the future global communication scenario. Moving from such a view the paper considers the technology trend and its influence on highspeed data converter design. Then, architectures of highspeed, high-resolution converters are resumed. Finally, design techniques and strategies for achieving the requirements of base-station systems are discussed.
TC4 Conference and Workshop 2002
· TC4
· 2002
· Download
Jan Saliga, Linus Michaeli, Roland Holcer
This paper deals with some error effects caused by additive noise at analog-to-digital converters (ADCs) testing based on the histogram method and the exponential shape of input testing signal. The histogram method with exponential signals has been an alternative test method for ADC developed by the author. Here, the theoretical analysis of some errors in estimation of code bin width and quantisation levels caused by additive input Gaussian noise is performed. The theoretical results are verified by simulations. The acquired results are compared with the analogues ones for sinewave and...
A.A. Platonov, L.M. Malkiewicz, K. Jedrzejewski
Analytical approach to optimization, analysis, modeling and testing of the adaptive cyclic (sub-ranging) analog-to-digital converters (CADC) is considered. The particularity of the approach is digital computing the estimates (codes) of the input signal samples using optimal signal - processing algorithm. Upper boundaries for resolution, speed of conversion, and information characteristics are determined. Methodic of advanced CADC model-based simulation investigations is presented. The efficiency of simulation experiments as reliable, convenient and low-cost tool significantly simplifying and...
Bruno Andò, Salvatore Baglio, Vito Caruso, Nicola Pitrone
The characterization of complex electronic devices is very important for technical as well as didactic reasons. The characterization of the micro-controllers involves the investigation on its peripheral devices, mainly the ADCs, the PWMs, the timer signals, sometimes the DACs. A testing platform has been realised, with reference to the ST52X430 micro-controller. Moreover, it has been improved in order to test the peripheral devices of the ST52X440 micro-controller. It consists of a board and some programmable instruments connected to a PC, on which the implemented software can run. The user...
Henrik Lundin, Patrick Svedman, Xi Zhang, Mikael Skoglund, Peter Händel, Per Zetterberg
This paper investigates some of the effects that ADC imperfections may have on wireless communication systems. First, an experimental communication system for wireless multiple-input multiple-output (MIMO) is described. In this test bed, an ADC behavioural model has been implemented. The resulting performance of the communication system, in terms of bit error rate, is assessed when the parameters of the ADC model are altered. The results show that, for this system, the ADC resolution is the key parameter while the non-linearity errors are of minor importance.
Jan Holub, Josef Vedral
Effective number of bits (ENOB) and normality test of code word histogram of Micro-Converter ADUC824 has been evaluated at the FEE CTU Prague and the methodology and results are shown and discussed in the paper.
J. Halámek, I. Višcor, M. Kasal, M. Villa, P. Cofrancesco
The ADC’s static and dynamic nonlinearity with relation to harmonic distortion and parameters describing the nonlinearity are discussed. The commonly used description by INL and hysteresis is acceptable only if the dynamic nonlinearity is significantly lower than the static nonlinearity. The significance of dynamic nonlinearity is presented on the measurement and the analysis based on complex spectrum is demonstrated. We call the attention to more detailed tests of ADC according to the dynamic nonlinearity and definition of an optimal working point with maximal SFDR.
Luca De Vito, Linus Michaeli, Sergio Rapuano
The paper presents the results of the experimental validation of a method for digital compensation of ADC non-linearity errors. First, the theory underlying the method is briefly described. Then, the compensation method has been validated both on sinusoidal signals and on 3 rd generation mobile telecommunication signals, compliant to 3GPP specifications.
Vladimir Haasz, David Slepicka
The main problem of the high resolution ADC testing within the frequency range hundreds of kHz to several MHz is the spectral purity of a testing signal. Commercially produced low-distortion generators have the spectral purity sufficient for testing of 16 bits ADCs only up to frequencies of tens of kHz; at higher frequencies the spectral purity of generators is generally worse. Some improvement can bring signal filtering. However, most of the LC filters use coils with ferromagnetic cores for the frequency range up to several hundreds of kHz, which can cause a rise of odd harmonic components....