Marek Kurkowski, Pawel Ptak, Zygmunt Biernacki, Tadeusz Zloto
Among the phenomena significantly aggravating the quality of electric energy in the grid two are especially important: voltage fluctuations and deformations of voltage and current sinusoids. The aim of the study described in the present paper was to improve the accuracy of signal converting in power measurements in non-linear receivers. The measurements of voltage and current were performed by means of a PC with measuring a card PCL-818L and with application software DasyLab 6.0 enabling the registration and converting of signals.
TC4 Conference and Workshop 2002
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· 2002
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Tamás Zoltán Bilau, Tamás Megyeri, Attila Sárhegyi, János Márkus, István Kollár
Small improvements to the iteration procedure of the IEEE Standard 1241-2001 are suggested, and extension of the standard MATLAB program implementing the sine wave test is discussed. The program is compatible with the LabView program already announced, and in other working modes offers extensions, too.
TC4 Conference and Workshop 2002
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Jerome J. Blair
A new definition is proposed for the effective number of bits of an ADC. This definition removes the variation in the calculated effective bits when the amplitude and offset of the sinewave test signal is slightly varied. This variation is most pronounced when test signals with amplitudes of a small number of code bin widths are applied to very low noise ADC's. The effectiveness of the proposed definition is compared with that of other proposed definitions over a range of signal amplitudes and noise levels.
TC4 Conference and Workshop 2002
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Salvatore Nuccio, Ciro Spataro
In the paper we present a numerical method, which permits to evaluate the measurement uncertainties of the A/D conversion based instruments overcoming the possible inapplicability of the pure theoretical approach prescribed in the ISO – "Guide to the Expression of Uncertainty in Measurement".
TC4 Conference and Workshop 2002
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Y. C. Jenq
In this paper, we investigate problems of D/A converters with non-uniformly sampled input data, and/or time-varying clock sources. The input digital data (which are stored in the memory to be read out and sent to a D/A converter) were obtained by sampling an analog waveform at non-uniform sampling intervals. (Quantization of data can also be considered as a form of non-uniform sampling.) Recently, there is available a new clocking system with a very fine time resolution and is capable of adjusting the clock period in a sample-to-sample basis. It is, therefore, interesting to consider the...
TC4 Conference and Workshop 2002
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F. Attivissimo, N. Giaquinto, M. Savino
The paper illustrates a new procedure, simple and very fast, to measure and correct the linearity error in A/D converters. The method is based on the Chebyshev polynomial synthesis of the static characteristic via frequency-domain analysis, and is especially effective for dithered converters.
TC4 Conference and Workshop 2002
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G. Bernardinis, A. Centuori, U. Gatti, P. Malcovati, F. Maloberti
In this paper we present a sigma-delta modulator for wide-band base transceiver station receivers. The modulator, based on a four-path architecture, achieves an equivalent sampling frequency of 320 MHz, although the building blocks operate at only 80 MHz. The circuit in simulation achieves 94 dB signal-to-noise ratio with a signal bandwidth of 5 MHz centered around an intermediate frequency of 80 MHz. Behavioral simulations of the complete sigma-delta modulator, including the most important non-idealities, as well as transistor-level simulations of the most critical building blocks are...
TC4 Conference and Workshop 2002
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G. Pasini, P. A. Traverso, D. Mirri, F. Filicori
The input/output relationship of a Sample/Hold and Analogue-to-Digital Conversion device (S/H-ADC) can be described as the response of a non-linear system with memory. A general-purpose “black-box” behavioural approach, based on a modified Volterra representation, has been proposed by authors for the modelling of a wide class of non-linear dynamic systems and specifically applied to the characterization of S/H-ADCs. In this paper, the instrumentation set-up and the experimental procedure for the extraction of S/H-ADC model parameters are presented and a novel standard for the...
TC4 Conference and Workshop 2002
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P. Arpaia, P. Daponte, S. Rapuano
The state of the art of the research on modelling of analog-to-digital converter-based measuring devices is surveyed. Main topics of modelling are reviewed according to the fields of prevailing scientific interest in metrological research such as quantization models, error models, and correction-aimed models. In these fields, recent developments are analysed with the aim of focusing both the contemporary situation and the imminent trends.
TC4 Conference and Workshop 2002
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P. Daponte, R. Holcer, L. Horniak, L. Michaeli, S. Rapuano
Digital post processing of output data is often used to enhance the ADC Effective Number Of Bits (ENOB). In particular, it can be used to partially recover ENOB restrictions caused by nonlinearities. The paper deals with advantages and disadvantages coming from the application of a proposed nonlinearity correction method based on the Bayes theorem. It allows the reduction of large scale errors in output signal by means of the use of dithering with low peakpeak voltage instead of a high amplitude one. The paper gives a brief description of the method. Then, the results of an experimental...
TC4 Conference and Workshop 2002
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