Petr Cesak, Jan Fischer, Jaroslav Roztocil
This paper presents an analog-to-digital converter (ADC) embedded as a peripheral in a microcontroller and influence of asynchronous digital input signals on results of ADC conversion. A schematic diagram of a successive approximation (SAR) ADC peripheral analog input circuit in a microcontroller was described and its model was designed. A practical measurement was performed using crosstalk measurement setup that consists of a MCB2100 Evaluation Board with a microcontroller LPC2129 and an external pulse generator triggered by the tested microcontroller. Measurement results proved that errors...
A.A. Platonov, Ł.M. Małkiewicz, K. Jedrzejewski
The goal of the paper is presentation of a new approach to the measurement of effective resolution (effective number of bits - ENOB) of the cyclic A/D converters (CADCs). The core idea of the approach is direct measurement of ENOB using, as a numerical measure, the number of true bits before the first erroneous bit (FEB) position. The position of FEB is determined as the first non-zero bit in the binary presentations of conversion errors. The definition of ENOB based on FEB is introduced and discussed. The particularities of the proposed method are analysed in simulation experiments. There...
S.Ursache, M. Branzila, C. Bratescu, R. Burlacu
This paper is a brief presentation of FDTD numerical method usable for simulation of electromagnetic shields behavior. The presentation is focused on this method that is appropriate for high frequency shields. A new class of auxetic materials, a hexachiral honeycomb structure with good mechanical properties, is investigated through computer simulation. Some simulation results are also presented in the final part of the paper.
Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements
· TC4
· 2008
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Aimé Lay-Ekuakille, Giuseppe Vendramin, Amerigo Trotta
In many circumstances software processing is the best and suitable way of improving image contrast, hence image quality. Different biomedical instrumentation and apparatuses encompass post processing units capable of optimal outcomes. However, in particular cases, especially for contour analysis, the above outcomes are not sufficient. Therefore, an alternative can be envisaged in designing image enhancer and intensifier to compensate image processing limitations. This aspect is very important regardless of computational costs of this alternative. This paper proposes some criteria of design...
Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements
· TC4
· 2008
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Sankaran P., Madhu Mohan N., Jagadeesh Kumar V.
The output of a Wheatstone bridge with only a single active resistive sensor is inherently nonlinear. A generalized feedback compensation scheme is presented in this paper that provides a linear output for a Wheatstone bridge with only a single active resistive sensor, even for large variations in the resistance of the sensor. Simulation studies and experimental verifications establish the efficacy of the proposed linearization technique. The proposed method is best suited for single active resistive sensors involving Resistive Temperature Devices (RTD) and piezo-resistive type sensors...
Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements
· TC4
· 2008
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Damir Ilić, Alan Šala, Ivan Leniček
A new automatic system is described whereby precise, simple and reliable intercomparison of electronic voltage standards is enabled by using a self-developed 16 channel low-thermal switch and digital nanovoltmeter, controlled by the computer. It enables faster and easier comparison, as well as optimisation of the whole procedure. The control software was developed using a LabVIEW, and the obtained parameters are pointed out. At the Primary Electromagnetic Laboratory, which is a part of the Faculty of Electrical Engineering in Zagreb, the maintenance of the unit of volt is one of its...
Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements
· TC4
· 2008
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Antonio Raffo, Valeria Vadalà, Pier Andrea Traverso, Alberto Santarelli, Giorgio Vannini, Fabio Filicori
Large-signal measurement systems based on high-frequency sinusoidal excitations have been widely exploited by the microwave community for the characterization of transistors under nonlinear operation. However, device characterization at high-frequencies necessarily involves the application of rather complex calibration procedures of the measurement setup. In addition, reactive effects associated with the device extrinsic parasitic effects tend to become more important at high-frequencies. Thus, uncertainties in the identification of the parasitic network components may lead in this case to...
Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements
· TC4
· 2008
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Romano Giannetti, Mirko Marracci, Bernardo Tellini, Carmine Zappacosta
We analyse the volt-amperometric (VI-) method for the characterization of minor loops of soft magnetic materials. By adopting several input signals and by operating at various frequencies in the 10 Hz – 10 kHz frequency range, we perform the measurement on a soft ferrite core. Through the use of two different measurement schemes, we control in the first case the voltage across– and in the second case the current through– the primary coil. Measurement results are reported and a comparison among the various techniques is provided throughout the paper. A commercial ferrite core and a Fe-Si thin...
Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements
· TC4
· 2008
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A. Bounouh, H. Camon, R. Plana, F. Ziadé, A. Polletaeff, D. Allal
This work explores the MEMS potentialities to fabricate flexible AC voltage references through mechanical-electrical transduction that could be used for high precision electrical metrology or for applications in miniaturized instrumentation. The design presented allows the generation of AC voltage reference ranging from 1V to 60 V using the same Epitaxial Silicon On Insulator (SOI) Surface Micromachining process that permits an accurate control of both dimensions and material properties. Different tests structures have been designed and fabricated. First results show a good agreement between...
Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements
· TC4
· 2008
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C.Bratescu, R.Burlacu, S. Ursache, R. Ciobanu
PDA-based instruments with wireless capabilities are a powerful aid to monitor and control applications. Using virtual instrumentation abilities of Labview 8.2, PDA, communications protocols and wireless devices we developed and tested some applications dedicated to the data transfer, workable for Pocket PC 2003. LabVIEW allow the addition of the dedicated module LabVIEW PDA Module, an essential resource in the development of graphical applications GUI usable on the PDA level
Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements
· TC4
· 2008
· Download