MAXIMUM LIKELIHOOD ESTIMATION OF ADC PARAMETERS FROM SINE WAVE TEST DATA |
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| László Balogh, Balázs Fodor, Attila Sárhegyi, István Kollár |
- Abstract:
- The sine wave test is maybe the most important method for characterizing ADC’s. By this, the acquisition device is excited with a sinusoidal signal, and a long series of output values is measured. With the help of these observations, the parameters of the DUT can be determined. The general method to do this is the Least Squares (LS). In this paper, we present a similar method using the Maximum Likelihood Estimation (MLE). It is more robust than the LS method, which has nice properties only under special conditions. This maximum likelihood problem is solvable only numerically. For this, a numerical method is presented, and simulation results are given. The main message of this paper is how to handle the problems of the estimation in the best way in order to extract possibly the full information from the measured data, and obtain a robust, effective algorithm.
- Keywords:
- IEEE standard 1241, ADC test, analog-to-digital converter, maximum likelihood estimation, Least Squares fit, sine wave fitting, effective number of bits, ENOB
- Download:
- IMEKO-IWADC-2007-F102.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- IWADC 2007
- Title:
12th IMEKO TC4 International Workshop on ADC Modeling and Testing IWADC (together with XVth IMEKO TC4 International Symposium on Novelties in Electrical Measurements and Instrumentation) (IWADC)
- Place:
- Iasi, ROMANIA
- Time:
- 19 September 2007 - 21 September 2007