IEEE TC-10: UPDATE 2008 |
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| Thomas E. Linnenbrink, William B. Boyer, Robert M. Graham, Nicholas G. Paulter, Jr., Steven J. Tilden |
- Abstract:
- There is a world-wide need to standardize terms, test methods, and the computation of performance parameters for devices that generate, measure, and analyze waveforms. Users need to be able to unambiguously specify the device performance required for particular applications. Manufacturers need to be able to unambiguously state the performance of their devices (e.g., instruments, components, etc.). Metrology facilities need to perform calibrations with well-defined methods to produce reliable test results expressed in clear terms. Measurement instruments need to acquire data with well-defined methods and present it clearly. Technical Committee 10 (TC-10), the Waveform Generation, Measurement, and Analysis Committee of the IEEE Instrumentation and Measurement (I&M) Society, is tasked to develop standards to address these needs. TC-10 has developed IEEE standards to define terms and test methods for Digitizing Waveform Recorders (IEEE Std 1057-2007), Analog-to-Digital Converters (IEEE Std 1241-2000) and Transitions, Pulses, and Related Waveforms (IEEE Std 181-2003). It is currrently working on similar standards for Digital-to-Analog Converters (P1658) and Circuit Probes (P1696).
- Download:
- IMEKO-IWADC-2008-088.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- IWADC 2008
- Title:
13th IMEKO TC4 Workshop on ADC Modelling and Testing IWADC (together with XVIth IMEKO TC4 International Symposium on Electrical Measurements and Instrumentation) (IWADC)
- Place:
- Florence, ITALY
- Time:
- 22 September 2008 - 24 September 2008