TOWARD A STANDARDIZED MULTI-SINEWAVE FIT ALGORITHM |
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| Tomas Andersson, Peter Händel |
- Abstract:
- Multi-sinewave test methods require algorithms for multiple-tone parameter estimation. There exist a vast amount of imeko_proceedings on the topic. This paper presents a generalization of the IEEE four-parameter sinewave fit algorithm suitable to handle data comprising multiple sinewaves. The proposed method directly estimates the 3 p + 1 parameters of a p-tone model. The algorithm is analyzed numerically with emphasize on its convergence properties and statistical efficiency. The initialization of the algorithm is of major importance and an attempt to formulate a proper initialization procedure is presented.
- Download:
- IMEKO-TC4-2004-059.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2004
- Title:
- XIII IMEKO TC4 International Symposium on Measurements for Research and Industrial Applications (together with IXth International Workshop on ADC Modeling and Testing, IWADC)
- Place:
- Athens, GREECE
- Time:
- 29 September 2004 - 01 October 2004