INTELLIGENT ANALYSIS OF GENOMIC MEASUREMENTS

I.N. Flaounas, D.K. Iakovidis, D.E. Maroulis, S.A. Karkanis
Abstract:
In this paper we propose a methodology for intelligent analysis of genomic measurements. It is based on a sequential scheme of Support Vector Machines and it can be used for class prediction of multiclass genomic samples. The proposed methodology was evaluated using two lung cancer datasets. The results are comparable and in many cases higher to the accuracy of relevant methodologies that have been proposed in the literature.
Download:
IMEKO-TC4-2004-083.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Symposium 2004
Title:
XIII IMEKO TC4 International Symposium on Measurements for Research and Industrial Applications (together with IXth International Workshop on ADC Modeling and Testing, IWADC)
Place:
Athens, GREECE
Time:
29 September 2004 - 01 October 2004