UNCERTAINTY AS THE COMPONENT OF THE MEASUREMENT RESULT IN MICROPROCESSOR INSTRUMENTS |
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| Romuald Masnicki, Janusz Mindykowski |
- Abstract:
- A traditional description of the measurement result obtained with the use of a definite measurement instrument is complemented by the information about its accuracy on the basis of technical specifications given by its producer or verified in checking and legalisation procedures. The paper presents the premises resulting from currently available technical possibilities, which show that it is purposeful to complement the set of functions realised in a microprocessor instrument with additional properties enabling the instrument user to access the information about the uncertainty of the measurement result. The configuration of the measurement instrument, which enables an access, apart from the measurement result, to the information about the uncertainty as the component of the result, is presented. The conditions referring to the set and programme configuration of the instrument, indispensable for the realisation of the proposed idea, are pointed out. The main ideas of the presented paper will be also found in the authors’ work.
- Download:
- IMEKO-TC4-2004-113.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2004
- Title:
- XIII IMEKO TC4 International Symposium on Measurements for Research and Industrial Applications (together with IXth International Workshop on ADC Modeling and Testing, IWADC)
- Place:
- Athens, GREECE
- Time:
- 29 September 2004 - 01 October 2004