TESTING ADCs FOR STATIC AND DYNAMIC NONLINEARITIES - KILLING TWO BIRDS WITH ONE STONE |
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| Carsten Wegener, Michael Peter Kennedy |
- Abstract:
- Traditionally, static linearity and dynamic distortion tests are performed separately for ADCs. To this end, a low-frequency sinewave is histogrammed to measure static Integral Nonlinearity, and a high-frequency sine-wave is sampled for FFT processing to measure dynamic distortions and dynamic range.
We propose to use a model-based technique to extract both static and dynamic nonlinearities from a single data record of a sampled high-frequency sine-wave. This saves test time as the ADC converts fewer samples. - Keywords:
- ADC testing, histogram, FFT, static and dynamic nonlinearities
- Download:
- IMEKO-TC4-2002-058.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Conference and Workshop 2002
- Title:
- 4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
- Place:
- Prague, CZECH REPUBLIC
- Time:
- 26 June 2002 - 28 June 2002