ECONOMICAL TEST OF INTERNAL ADC IN EMBEDDED SYSTEMS |
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| Josef Vedral, Jakub Svatoš, Pavel Fexa |
- Abstract:
- This paper describes two methods for economical test of dynamic parameters ADCs in embedded Data Acquisition Systems. First method is Exponential Fit Test, second method is Wobbler Test. Common testing methods are mentioned as far the accuracy and time necessary for the complete test are concerned. The tests for fast evaluation of the dependence of an effective number of bits on frequency of input signal are described and the comparison of proposed method with the standard methods is given.
- Keywords:
- ADC test, Exponentional Fit Test, Frequency Wobbler test
- Download:
- IMEKO-WC-2009-TC4-015.pdf
- DOI:
- -
- Event details
- Event name:
- XIX IMEKO World Congress
- Title:
Fundamental and Applied Metrology
- Place:
- Lisbon, PORTUGAL
- Time:
- 06 September 2009 - 11 September 2009