DESIGN OF THE PROTOTYPE OF PLD AUTO TEST PLATFORM |
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| Senzu Shen, Hua Li, Zhengle Shi, Minghu Zhang, Qian Liu |
- Abstract:
- There're mainly two different situations for testing PLD (Programmable Logic Device) devices. One is testing of blank chips that haven't been programmed; the other is testing of ASIC (Application Specific Integrated Circuit) devices that have been programmed. This paper presents a test method for programmed ASIC devices, including auto test and ATPG (Auto Test Pattern Generation) method for both known and unknown logics of programmed ASIC devices.
- Keywords:
- PLD, auto test, ATPG
- Download:
- IMEKO-WC-2009-TC4-085.pdf
- DOI:
- -
- Event details
- Event name:
- XIX IMEKO World Congress
- Title:
Fundamental and Applied Metrology
- Place:
- Lisbon, PORTUGAL
- Time:
- 06 September 2009 - 11 September 2009